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名师讲堂:Advancing Digital Systems Test Technology from Gigahertz to Terahertz
发布日期:2023-09-20 作者:

教师发展中心“名师讲堂”活动特别邀请IEEE Fellow、东方理工高等研究院David Clark Keezer教授来校作学术交流。具体安排如下,欢迎广大师生参加。

一、主 题:Advancing Digital Systems Test Technologyfrom Gigahertz to Terahertz

二、主讲人:IEEE Fellow、东方理工高等研究院 David Clark Keezer 教授

三、时 间:2023年9月21日(周四)10:00

四、地 点: 清水河校区4号楼电子学院A区431会议室

五、主讲内容:

In the 1990s, digital systems moved into the Gigahertz realm, accompaniedby significant technological challenges, including how to test such systems accuratelyand economically. Today, the challenge is 100-1000x greater, with individual signal rates of ~100 Gb/s and aggregate rates above 1 Tb/s. At these speeds, time measurement resolution and accuracy must be maintained to tens or hundreds of femtoseconds while bit-error-rate (BER) is measured in parts-per-trillion (10-12).This presentation will describe some “high-speed” testing methods that were developed during the past 30 years that met advanced testing requirements, even as the definition of “high-speed” has evolved from Gigahertz to Terahertz. Dr. Keezer will describe his first-hand experiences as well as outline some prospects for meeting the needs of future terahertz systems.

六、主讲人简介:

Dr. David Clark Keezer is a Chair Professor at EIT Institute for Advanced Studies in Ningbo China and Professor emeritus at Georgia Institute of Technology (US News and World Reports Rank #4). He is an IEEE Fellow (since 2010), specializing in the design and test of ultra-high speed multiGHz electronic systems. He has published over 270 journal and conference papers, spanning 40 years of research. His total research funding has exceeded $10,000,000. For 40 years, Professor Keezer has relentlessly pushed the advancement of electrical testing technology, emphasizing the development of techniques for multi-GHz logic systems. He has been a pioneer in extending the capabilities of automated test equipment (ATE) up to 10X their original performance level using intelligent load-board electronics, with improved accuracy, and at low-cost. He has graduated 11 PhDs and 19 Master’s students and taught numerous classes to thousands of students at both the graduate and undergraduate levels. Prof. Keezer has also provided extensive service to the electronics profession through his participation at IEEE workshops, symposia, and conferences. These notably include: (1) over 10 years continuous service on the ITC Program Committee, (2) continuing service on the Intl Mixed Signal Test Workshop (IMSTW), (3) several years leading the Gigahertz Test Workshop (GTW) as Technical or General Chair, and (4) services as an author, reviewer, session chair, program committee member on numerous other IEEEsponsored workshops and conferences. In recognition for these efforts, Prof. Keezer has received several honors, including the IEEE Computer Society “Golden Core” award. Prof. Keezer graduated in 1983 with a PhD in Electrical Engineering from Carnegie-Mellon University. His other degrees are a Master’s in Applied Physics from Caltech in 1979, a bachelor’s degree in Physics and Applied Mathematics from University of California at Berkeley in 1978, and a Master of Business Administration (MBA) from Florida Institute of Technology in 1985.

七、主办单位:教师发展中心

  承办单位:电子科学与工程学院